说明
DEFECT INSPECTION配置
无配置OEM 型号描述
The Candela CS10 Optical Surface Analyzer is a compact device that offers exceptional sensitivity to particles and scratches on 2"-12" wafers using dual-laser Optical X-Beam technology. It simultaneously measures phase shift, scattered light, reflected light, and topography to detect and classify wafer surface defects. It is well-suited for laboratory and low volume production applications, and is easy to learn and operate.文件
无文件
KLA
CANDELA CS10
已验证
类别
Defect Inspection
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
87188
晶圆尺寸:
3"/75mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部KLA
CANDELA CS10
类别
Defect Inspection
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
87188
晶圆尺寸:
3"/75mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
DEFECT INSPECTION配置
无配置OEM 型号描述
The Candela CS10 Optical Surface Analyzer is a compact device that offers exceptional sensitivity to particles and scratches on 2"-12" wafers using dual-laser Optical X-Beam technology. It simultaneously measures phase shift, scattered light, reflected light, and topography to detect and classify wafer surface defects. It is well-suited for laboratory and low volume production applications, and is easy to learn and operate.文件
无文件