说明
Wafer Inspection配置
无配置OEM 型号描述
The Candela CS10 Optical Surface Analyzer is a compact device that offers exceptional sensitivity to particles and scratches on 2"-12" wafers using dual-laser Optical X-Beam technology. It simultaneously measures phase shift, scattered light, reflected light, and topography to detect and classify wafer surface defects. It is well-suited for laboratory and low volume production applications, and is easy to learn and operate.文件
无文件
类别
Defect Inspection
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
138027
晶圆尺寸：
未知
年份：
2010
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
CANDELA CS10
类别
Defect Inspection
上次验证： 今天
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
138027
晶圆尺寸：
未知
年份：
2010
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer Inspection配置
无配置OEM 型号描述
The Candela CS10 Optical Surface Analyzer is a compact device that offers exceptional sensitivity to particles and scratches on 2"-12" wafers using dual-laser Optical X-Beam technology. It simultaneously measures phase shift, scattered light, reflected light, and topography to detect and classify wafer surface defects. It is well-suited for laboratory and low volume production applications, and is easy to learn and operate.文件
无文件