说明
Critical Dimension (CD) Measurement (non SEM)配置
无配置OEM 型号描述
The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.文件
无文件
类别
Metrology
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
134971
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
SpectraShape 9000
类别
Metrology
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
134971
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Critical Dimension (CD) Measurement (non SEM)配置
无配置OEM 型号描述
The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.文件
无文件