说明
Equipment Type Contact stylus surface profiler Measurement Method Contact stylus profilometry Max. Sample Size 254 mm Max. Scan Length 60 mm Vertical Range 13 µm to 300 µm Vertical Resolution 1 Å at 13 µm range; 25 Å at 300 µm range Scan Speed 1 µm/s to 25 mm/s Stylus Force 1–100 mg Typical Analysis Step height / Roughness / Waviness配置
无配置OEM 型号描述
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.文件
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KLA
P-10
类别
Profiler
上次验证： 8 天前
物品主要详细信息
状况：
Used
运行状况:
Deinstalled
产品编号：
153958
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Equipment Type Contact stylus surface profiler Measurement Method Contact stylus profilometry Max. Sample Size 254 mm Max. Scan Length 60 mm Vertical Range 13 µm to 300 µm Vertical Resolution 1 Å at 13 µm range; 25 Å at 300 µm range Scan Speed 1 µm/s to 25 mm/s Stylus Force 1–100 mg Typical Analysis Step height / Roughness / Waviness配置
无配置OEM 型号描述
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.文件
无文件