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KLA HRP-240
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The HRP-240 is an automated high-resolution surface metrology tool that provides long scan profilometry and high-resolution imaging for CMP and Etch applications. It has a new Dipping Mode™ capability for high aspect ratio depth monitoring and is reliable and easy to use for high-speed step height monitoring. It is the best solution for topographic metrology for wafer sizes up to 200 mm and can be configured as a basic profiler or a high-resolution, high aspect ratio instrument.
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    已验证

    类别
    Profiler

    上次验证: 6 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    150705


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
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    KLA HRP-240

    KLA

    HRP-240

    Profiler
    年份: 0状况: 二手
    上次验证6 天前

    KLA

    HRP-240

    verified-listing-icon
    已验证
    类别
    Profiler
    上次验证: 6 天前
    listing-photo-14a5a7e081594db88bea91dae33e86ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49649/14a5a7e081594db88bea91dae33e86ce/8258e2af589943978ee5b09fd892a2da_78e2e6daffce4fc687ad57436fb4dd4045005c_f.jpeg
    listing-photo-14a5a7e081594db88bea91dae33e86ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49649/14a5a7e081594db88bea91dae33e86ce/6b946014cb2641f4b139d033459ff060_5d632b1f7e9342a485d5863b473b37a845005c_f.jpeg
    listing-photo-14a5a7e081594db88bea91dae33e86ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49649/14a5a7e081594db88bea91dae33e86ce/db6f293f074d4c66aff736d9c138a381_336e39ed735140b1a037e9cda7bf73bc45005c_f.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    150705


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The HRP-240 is an automated high-resolution surface metrology tool that provides long scan profilometry and high-resolution imaging for CMP and Etch applications. It has a new Dipping Mode™ capability for high aspect ratio depth monitoring and is reliable and easy to use for high-speed step height monitoring. It is the best solution for topographic metrology for wafer sizes up to 200 mm and can be configured as a basic profiler or a high-resolution, high aspect ratio instrument.
    文件

    无文件

    类似上架物品
    查看全部
    KLA HRP-240

    KLA

    HRP-240

    Profiler年份: 0状况: 二手上次验证:6 天前
    KLA HRP-240

    KLA

    HRP-240

    Profiler年份: 0状况: 二手上次验证:30 多天前
    KLA HRP-240

    KLA

    HRP-240

    Profiler年份: 0状况: 二手上次验证:60 多天前