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KLA HRP-240
    说明
    Surface topography measuring machine
    配置
    无配置
    OEM 型号描述
    The HRP-240 is an automated high-resolution surface metrology tool that provides long scan profilometry and high-resolution imaging for CMP and Etch applications. It has a new Dipping Mode™ capability for high aspect ratio depth monitoring and is reliable and easy to use for high-speed step height monitoring. It is the best solution for topographic metrology for wafer sizes up to 200 mm and can be configured as a basic profiler or a high-resolution, high aspect ratio instrument.
    文件

    无文件

    KLA

    HRP-240

    verified-listing-icon

    已验证

    类别
    Profiler

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    110997


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA HRP-240

    KLA

    HRP-240

    Profiler
    年份: 0状况: 二手
    上次验证60 多天前

    KLA

    HRP-240

    verified-listing-icon
    已验证
    类别
    Profiler
    上次验证: 60 多天前
    listing-photo-ff340e1361164ede9f8ced25df43274b-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    110997


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Surface topography measuring machine
    配置
    无配置
    OEM 型号描述
    The HRP-240 is an automated high-resolution surface metrology tool that provides long scan profilometry and high-resolution imaging for CMP and Etch applications. It has a new Dipping Mode™ capability for high aspect ratio depth monitoring and is reliable and easy to use for high-speed step height monitoring. It is the best solution for topographic metrology for wafer sizes up to 200 mm and can be configured as a basic profiler or a high-resolution, high aspect ratio instrument.
    文件

    无文件

    类似上架物品
    查看全部
    KLA HRP-240

    KLA

    HRP-240

    Profiler年份: 0状况: 二手上次验证:60 多天前
    KLA HRP-240

    KLA

    HRP-240

    Profiler年份: 0状况: 二手上次验证:60 多天前
    KLA HRP-240

    KLA

    HRP-240

    Profiler年份: 0状况: 二手上次验证:60 多天前